中国安全科学学报 ›› 2019, Vol. 29 ›› Issue (5): 73-78.doi: 10.16265/j.cnki.issn1003-3033.2019.05.013

• 安全工程技术科学 • 上一篇    下一篇

列控车载设备安全功能测试序列优化方法研究

窦磊, 李耀, 郭进 教授, 童音 讲师, 兰浩   

  1. 西南交通大学 信息科学与技术学院,四川 成都 611756
  • 收稿日期:2019-01-14 修回日期:2019-03-16 发布日期:2020-11-02
  • 作者简介:窦磊(1995—),男,安徽六安人,硕士研究生,研究方向为铁路信号安全关键软件测试。E-mail:L_doude@163.com。
  • 基金资助:
    国家自然科学基金青年基金资助(61703349,61803317);中国铁路总公司科技研究开发计划课题(2017X007-D);甘肃省高原交通信息工程及控制重点实验室项目(20161103)。

Research on optimization method for safety function test sequence of on-board equipment

DOU Lei, LI Yao, GUO Jin, TONG Yin, LAN Hao   

  1. School of Information Science and Technology, Southwest Jiaotong University, Chengdu Sichuan 611756, China
  • Received:2019-01-14 Revised:2019-03-16 Published:2020-11-02

摘要: 列控系统测试序列优化问题可以转换成旅行商问题(TSP),在求解TSP时,用改良圈(IC)算法难以得出最优解,而模拟退火(SA)算法计算迭代次数多,为解决这一问题,提出一种基于SA优化IC算法的测试序列优化方法。首先,以车载设备模式转换功能为例,介绍基于TSP的测试序列生成方法;然后,说明SA优化IC算法的步骤和流程;最后,引入实例,并将其转换成TSP,采用SA算法优化IC算法求解TSP,并得到测试序列。结果表明:该算法较IC算法的结果更优,迭代次数较SA算法迭代次数降低了27.54%,该方法可有效优化测试序列。

关键词: 列控系统, 车载设备, 旅行商问题(TSP), 测试序列, 改良圈(IC)算法, 模拟退火(SA)算法

Abstract: The problem of test sequence optimization in train control system could be transformed into TSP which is difficult to find the optimal solution by use of IC algorithm and results in lots of iterations through SA algorithm, so to solve this problem, the test sequence optimization method based on SA optimization IC algorithm is proposed. Firstly, the test sequence generation method based on TSP was introduced with the mode transition function of on-board equipment as an example. Then, the steps and flow of SA optimization IC algorithm were explained. Finally, an example was introduced and converted into TSP to solve which SA optimization IC algorithm was applied before the test sequence was obtained. The results show that the proposed algorithm proves to be better than IC algorithm, and the number of iterations is reduced by 27.54% compared with SA algorithm, thus making it an effective method to optimize the test sequence.

Key words: train control system, on-board equipment, traveling salesman problem (TSP), test sequence, improved circle (IC) algorithm, simulated annealing (SA) algorithm

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