中国安全科学学报 ›› 2019, Vol. 29 ›› Issue (S1): 52-57.doi: 10.16265/j.cnki.issn1003-3033.2019.S1.011

• 安全工程技术科学 • 上一篇    下一篇

基于任务剖面的牵引逆变器IGBT寿命预测*

林帅, 方晓春, 林飞, 杨中平   

  1. 北京交通大学 电气工程学院,北京 100044
  • 收稿日期:2019-03-28 修回日期:2019-05-13 出版日期:2019-06-30 发布日期:2020-10-28
  • 作者简介:林 帅 (1994—),男,山东烟台人,博士研究生,主要研究方向为牵引传动系统的可靠性技术。E-mail:18117013@bjtu.edu.cn。
  • 基金资助:
    中央高校基本科研业务费专项资金资助(2019JBM061);台达电力电子科教发展计划资助项目(DREG2019017)。

Mission profiles-based lifetime prediction for IGBT modules in traction inverter application

LIN Shuai, FANG Xiaochun, LIN Fei, YANG Zhongping   

  1. School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China
  • Received:2019-03-28 Revised:2019-05-13 Online:2019-06-30 Published:2020-10-28

摘要: 为提高牵引变流器的可靠性,进一步节省成本,对牵引变流器的关键部件绝缘栅双极性晶体管(IGBT)进行基于任务剖面的寿命预测。首先,构建城市轨道交通牵引传动系统电热模型,分别采用基于电流开环和单电流闭环弱磁控制2种不同的异步电机全速域控制策略,获取相应控制策略下绝缘栅双极性晶体管的结温;然后,采用雨流计数法提取绝缘栅双极性集体管承受的热循环的结温信息(包括结温波动和结温最大值);最后,采用迈纳线性累积损伤理论计算每个热循环对绝缘栅双极性晶体管造成的损伤,预测2种全速域控制策略下绝缘栅双极性晶体管的寿命。仿真结果表明:基于单电流闭环弱磁控制的全速域控制策略,能够有效提高绝缘栅双极性晶体管的寿命,进而提高牵引变流器的可靠性。

关键词: 绝缘栅双极性晶体管(IGBT)模块, 寿命预测, 任务剖面, 牵引逆变器, 可靠性

Abstract: To improve reliability of traction converter and save cost, the mission profiles-based lifetime prediction was performed on the IGBT modules, the key component in traction system. Firstly, the electro-thermal model was built and the junction temperature of IGBT was obtained under two different full-speed range control schemes of induction motor (IM), which based on current open loop and single current close loop flux weakening control respectively. Then, the rain-flow counting method was adopted to extract the junction temperature information (including the fluctuation and maximum of junction temperature) of thermal cycles that IGBT suffered from. Finally, the Miner linear accumulation damage theory was employed to calculate the damage of IGBT caused by each thermal cycle, and the lifetimes of IGBT were predicted under two different control schemes. The simulation results show that the full-speed range control scheme based on single current close loop flux weakening control can effectively improve the lifetime of IGBT and thus improve the reliability of traction system.

Key words: insulated gate bipolar transistor (IGBT) modules, lifetime prediction, mission profiles, traction inverters, reliability

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