Abstract: The problem of test sequence optimization in train control system could be transformed into TSP which is difficult to find the optimal solution by use of IC algorithm and results in lots of iterations through SA algorithm, so to solve this problem, the test sequence optimization method based on SA optimization IC algorithm is proposed. Firstly, the test sequence generation method based on TSP was introduced with the mode transition function of on-board equipment as an example. Then, the steps and flow of SA optimization IC algorithm were explained. Finally, an example was introduced and converted into TSP to solve which SA optimization IC algorithm was applied before the test sequence was obtained. The results show that the proposed algorithm proves to be better than IC algorithm, and the number of iterations is reduced by 27.54% compared with SA algorithm, thus making it an effective method to optimize the test sequence.

Key words: train control system, on-board equipment, traveling salesman problem (TSP), test sequence, improved circle (IC) algorithm, simulated annealing (SA) algorithm